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Collection : Universite Grenoble Alpes

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Academic Journal

Investigations of transient phase formation in Ti/Si thin film reaction

Authors : Chaix-Pluchery, Odette; Chenevier, Bernard; Matko, Igor ...

Subjects: Ti/Si thin film; in-situ X-ray diffraction; TEM

Source: ISSN: 0021-8979.

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Academic Journal

Annealing of thin Zr films on Si1-xGex (0≤x≤1): X-ray diffraction and Raman studies

Authors : Chaix-Pluchery, Odette; Chenevier, Bernard; Aubry-Fortuna, Valérie ...

Subjects: Zr/SiGe thin films; Raman spectroscopy; X-ray diffraction

Source: ISSN: 0022-3697 ; Journal of Physics and Chemistry of Solids ; https://hal.science/hal-00207762 ; Journal of Physics and Chemistry of Solids, 2002, 63, pp.1889.

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